Growth Methods |
Cz, MCz |
Diameter |
150, 200mm |
Crystal Orientation |
<100>, <110>, <111> |
N Type Dopants |
Arsenic, Phosphorus, Red Phosphorus |
P Type Dopants |
Boron |
Resistivity |
<1mOhm-cm up to over 5,000 Ohm-cm |
Thickness |
SOI layer: up to > 200um, standard tolerance ±0.3um (for specific applications < even tighter) Handle wafer: from 300 um to 950 um Back surface polished or etched |
Buried Oxide: |
Type: Thermal Oxide |
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